Visit ECI at Semicon Japan, Dec 7-9, 2011.  We will demonstrate our newest technologies for Chemical Management and Control, including Quali-Fill Chemical Management Systems for Wafer Level Packaging applications, Quali-Surf Chemical Monitoring System for Silicon Nitride Etch (Hot Phosphoric Solutions), Quali-Line Chemical Monitoring System for Cu Damascene Process, and SurfaceScan Surface Characterization and Oxide Analysis for components and wires.

Look for us in Booth 7C-1002.